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Components, including semiconductor wafers and integrated circuits, can be evaluated through specialized X-ray irradiation applications that measure Total Ionizing Dose (TID) before integration into final designs. By exposing these components to controlled radiation levels, this method provides critical insight into device durability and quality control.

CONFIDENCE THROUGH TESTING

Your components validated under extreme radiation conditions

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Designed for long-term reliability

FULLY INTEGRATED DOSIMETRY

Customized to specific applications

ALL IN ONE PLATFORM

Unified workflow & dedicated software

Applications

Defense & Security

Defense & Security

Total Ionizing Dose (TID) effect directly impacts the reliability, survivability, and mission assurance of electronic systems operating in radiation-rich or hostile environments.

Semiconductor Manufacturing

Semiconductor Manufacturing

Total Ionizing Dose (TID) effect directly impact the reliability, long-term performance, and yield of semiconductor wafers exposed to radiation-rich or hostile environments.

Nuclear Environments

Nuclear Environments

In nuclear facilities, electronic systems must operate reliably under continuous radiation exposure. Evaluating Total Ionizing Dose (TID) effects is essential to maintaining performance, safety, and operational integrity.

Space & Aerospace

Space & Aerospace

Space and aerospace electronics are exposed to ionizing radiation that can degrade performance over time, making TID management critical for reliability and mission success.

FAQs

What is Total Ionizing Dose (TID)?

Total Ionizing Dose (TID) refers to the cumulative amount of ionizing radiation absorbed by a material or electronic device over time. It is typically measured in rad or gray (Gy) and is used to evaluate long-term radiation exposure effects on components and systems.

TID exposure can cause gradual degradation in electronic performance, including threshold voltage shifts, increased leakage current, timing errors, functional instability, and eventual device failure—particularly in semiconductor-based components.

TID testing helps to quantify how long electronic components and systems can operate reliably in radiation-harsh environments. It is critical for qualifying components used in space, aerospace, defense, nuclear, medical, and high-energy physics applications.

Common  uses include:

– Aerospace and space systems

– Defense and military electronics

– Nuclear energy and research

– Medical imaging and therapy equipment

– High-reliability industrial electronics

Total Ionizing Dose (TID) effect testing is conducted by exposing devices to a controlled ionizing radiation source while monitoring electrical performance over time. Dose rates, total dose levels, and test conditions are tailored to application-specific requirements and industry standards.

  • TID (Total Ionizing Dose) effect evaluates cumulative, long-term radiation damage
  • SEE (Single Event Effects) focuses on instantaneous, radiation-induced disruptions or failures

 

Both are essential for comprehensive radiation qualification.

X-ray systems provide a controlled, repeatable, and cost-effective method for simulating high levels of ionizing radiation exposure without the regulatory and logistical challenges associated with radioactive sources.

Over 20 Years

in X-ray technology

OVER 1,800

system installations globally

DEDICATED

service & support

EXPLORE PRECISION X-RAY, INC. SYSTEMS

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    Precision X-Ray, Inc.

    14 New Road
    Madison, CT
    06433