Smarter Tests. Stronger Builds.

Total lonizing Dose (TID) testing is a critical application in evaluating performance and reliability under extreme radiation conditions. By exposing components to controlled X-ray radiation, TID testing simulates the cumulative ionizing effects that devices experience over time in real-world or high-radiation environments. This process enables engineers to assess how radiation impacts device parameters, such as threshold voltage shifts, leakage currents, and overall functionality.

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