Laue Single Crystal Orientation System
Laue Single Crystal
Orientation System
Single crystal materials are playing an important role in novel devices, from non-linear optics to jet engine turbine blades and super conducting materials.
A high-resolution Crystal Orientation System is the ideal tool to capture and analyze the Laue diffraction pattern from a wide range of crystalline materials. With dedicated software, the orientation of single crystals can be measured quickly with excellent accuracy.
VERTICAL LAUE SYSTEM
HORIZONTAL LAUE SYSTEM
GRAIN MAPPING
KEY FEATURES
- Benchtop System
- Plug-n-Play, compact cabinet system. No customized bench requirements
- Manual and fully automated Multi-Axis Stages and Goniometer options
- CCD back reflection, high-resolution, high- sensitivity x-ray detector
- High-throughput sample screening
- Dedicated Laue Software with mis- orientation measurement
- Small beam size of 450 µm standard or 250 µm with fine focus covers samples from extremely small to heavy-duty
- Live viewing of sample positioning with on- board camera
- Distance sensor for precise and reproducible indexation measurements of Laue patterns
LAUE IMAGE
ALIGNMENT SOFTWARE
Compatible with CFL data files
Saves angular measurements in CSV format
for Quality Assurance traceability
Remote access control
for ongoing service support, minimizing downtime
Automatic detection of diffraction spots
and calculates spot position against reference crystal
Automatic calculation of mis-orientation
against goniometer and crystallographic axis down to 0.05°
Top to Bottom intuitive workflow
for multiuser operation and non-crystallography experts
Applications
- Crystal Cutting
- Real Time Crystal Orientation
- Crystal Characterization
- Crystal Growth
- Photovoltaic Inspection
- Gem Inspection
- Semiconductor Crystals
- Wafer inspection
VERTICAL LAUE SYSTEM
The most flexible configuration, the PSEL vertical Laue system uses a vertical beam path for high throughput scanning of multiple crystals in isolation or multiple areas of interest. Using gravity, samples do not need to be adhered to the platform, allowing for easier mounting, and orienting of crystals.
The vertical beam path takes up less space within the cabinet leaving more room for the addition of alternate inspection modalities or other modality optics, and increased tilt and rotation range for the goniometer to operate; while a <450um beam size accommodates both sub-millimetric range samples and larger components like turbine alloys.
HORIZONTAL LAUE SYSTEM
Traditional configuration, the PSEL horizontal Laue System provides a unique solution to orient the crystal for cutting or quickly scanning the crystal to identify reflections. Manual or automated goniometers and XYZ Stage options are available to best suit your experimental needs.
GRAIN MAP
Available with the Vertical configuration, Grain map features a special camera, lens, illumination, and mapping software used to measure the orientation of each grain.
